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contribution for stress-strain analysis
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| <?xml version="1.0" encoding="UTF-8"?> | ||
| <?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?> | ||
| <!-- | ||
| # NeXus - Neutron and X-ray Common Data Format | ||
| # | ||
| # Copyright (C) 2008-2022 NeXus International Advisory Committee (NIAC) | ||
| # | ||
| # This library is free software; you can redistribute it and/or | ||
| # modify it under the terms of the GNU Lesser General Public | ||
| # License as published by the Free Software Foundation; either | ||
| # version 3 of the License, or (at your option) any later version. | ||
| # | ||
| # This library is distributed in the hope that it will be useful, | ||
| # but WITHOUT ANY WARRANTY; without even the implied warranty of | ||
| # MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU | ||
| # Lesser General Public License for more details. | ||
| # | ||
| # You should have received a copy of the GNU Lesser General Public | ||
| # License along with this library; if not, write to the Free Software | ||
| # Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA | ||
| # | ||
| # For further information, see http://www.nexusformat.org | ||
| --> | ||
| <definition name="NXstress" extends="NXobject" type="group" category="contributed" xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd"> | ||
| <symbols> | ||
| <symbol name="nD"> | ||
| <doc>Number of diffractogram channels</doc> | ||
| </symbol> | ||
| <symbol name="nP"> | ||
| <doc>Number of reflections</doc> | ||
| </symbol> | ||
| </symbols> | ||
| <doc> | ||
| Application definition for stress and strain analysis defined in the scope of the EASI-STRESS project (https://easi-stress.eu). | ||
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| When a crystal is loaded (applied or residual stress) its crystallographic parameters change. | ||
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| Stress and strain analysis calculates deformation (strain) and the associated force (stress) from diffraction data. | ||
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| This application definition is based on reflections and their properties as derived from different types of diffraction experiments. | ||
| </doc> | ||
| <group type="NXentry"> | ||
|
|
||
| <field name="definition" type="NX_CHAR"> | ||
| <doc> Official NeXus NXDL schema to which this file conforms </doc> | ||
| <enumeration> | ||
| <item value="NXstress" /> | ||
| </enumeration> | ||
| </field> | ||
|
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| <field name="title" optional="true"> | ||
| <doc>Extended title for entry</doc> | ||
| </field> | ||
| <field name="experiment_identifier" recommended="true"> | ||
| <doc> | ||
| Unique identifier for the experiment, | ||
| defined by the facility, | ||
| possibly linked to the proposals | ||
| </doc> | ||
| </field> | ||
| <field name="experiment_description" optional="true"> | ||
| <doc>Brief summary of the experiment, including key objectives.</doc> | ||
| </field> | ||
| <field name="collection_identifier" optional="true"> | ||
| <doc>User or Data Acquisition defined group of data.</doc> | ||
| </field> | ||
| <field name="collection_description" optional="true"> | ||
| <doc>Brief summary of the collection, including grouping criteria.</doc> | ||
| </field> | ||
| <field name="entry_identifier" optional="true"> | ||
| <doc>Unique identifier for the measurement, defined by the facility.</doc> | ||
| </field> | ||
|
|
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| <group type="NXinstrument"> | ||
| <field name="name"> | ||
| <doc>Name of instrument</doc> | ||
| <attribute name="short_name"> | ||
| <doc>short name for instrument, perhaps the acronym</doc> | ||
| </attribute> | ||
| </field> | ||
| <group type="NXdetector" minOccurs="0" maxOccurs="unbounded"> | ||
| <field name="description"> | ||
| <doc>name/manufacturer/model/etc. information</doc> | ||
| </field> | ||
| </group> | ||
| </group> | ||
|
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| <group type="NXdata" minOccurs="1" maxOccurs="unbounded"> | ||
| <doc>At least one of these groups need to be present. It contains the result of a diffractogram fit.</doc> | ||
| <attribute name="axes"> | ||
| <enumeration> | ||
| <item value="['CHANNELS']" /> | ||
| </enumeration> | ||
| </attribute> | ||
|
|
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| <attribute name="signal"> | ||
| <enumeration> | ||
| <item value="diffractogram" /> | ||
| </enumeration> | ||
| </attribute> | ||
| <field name="CHANNELS" type="NX_NUMBER" nameType="any"> | ||
| <doc>Diffractogram channels</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nD" /> | ||
| </dimensions> | ||
| </field> | ||
| <field name="diffractogram" type="NX_NUMBER"> | ||
| <doc>Diffractogram counts (default signal)</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nD" /> | ||
| </dimensions> | ||
| </field> | ||
| <field name="fit" type="NX_NUMBER"> | ||
| <doc>Diffractogram fit counts (auxiliary signal)</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nD" /> | ||
| </dimensions> | ||
| </field> | ||
| <field name="background" type="NX_NUMBER" minOccurs="0"> | ||
| <doc>Diffractogram background counts (auxiliary signal)</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nD" /> | ||
| </dimensions> | ||
| </field> | ||
| <field name="residuals" type="NX_NUMBER" minOccurs="0"> | ||
| <doc>Difference between diffractogram and fit (auxiliary signal)</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nD" /> | ||
| </dimensions> | ||
| </field> | ||
| </group> | ||
|
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| <group name="reflections" type="NXdata"> | ||
| <doc>This group contains all reflection parameters derived from diffractogram fitting and other data.</doc> | ||
| <field name="h" type="NX_INT"> | ||
| <doc>First Miller index</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nP" /> | ||
| </dimensions> | ||
| </field> | ||
| <field name="k" type="NX_INT"> | ||
| <doc>Second Miller index</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nP" /> | ||
| </dimensions> | ||
| </field> | ||
| <field name="l" type="NX_INT"> | ||
| <doc>Third Miller index</doc> | ||
| <dimensions rank="1"> | ||
| <dim index="1" value="nP" /> | ||
| </dimensions> | ||
| </field> | ||
| </group> | ||
| </group> | ||
| </definition> |