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Pattern
The Standard test data format is defined to keep track of testing data during chip manufacturing and used by almost all tester manufacturers. The official documentation can be found at http://www.kanwoda.com/wp-content/uploads/2015/05/std-spec.pdf.
I tested it with an example published by Roos (https://roos.com/docs/RBEH-AH4R8T?Open) but did not include that in the PR as they list it as "confidential and proprietary" (though I find "confidential" an interesting statement for smthg hosted publicly...).
I also tested it multiple internal files from other vendors, which I can't share. I'm checking with a colleague whether they can provide some small file that doesn't include any proprietary information but my hopes are not too high - so I opened the PR anyways. I hope this is still OK, would raise another PR if/when I get a file.
The one that could be improved here is the displaying of nibble fields, but I didn't figure out a nice way to do it, other then creating a section - which kind of explodes with the usual file sizes.
Also editing could be improved...
Checklist
[x] A pattern for this format doesn't exist yet (or this PR improves the existing one)
[x] The new pattern has been added to the relevant table in the Readme
[x] The new pattern has a description pragma (#pragma description My pattern Description here)
[x] The pattern was associated with all relevant MIME types (using #pragma MIME mime-type in the source code)
[ ] A test file for this pattern has been added to /tests/patterns/test_data